Multiple Use Microscopy Calibration and AFM Profilometry MRS-4

Multiple Use Microscopy Calibration and AFM Profilometry MRS-4

Marsoni

M251S

$4935.93

Get it in 3 business days with 1 day shipping. Friday, May 29

Multiple Use Microscopy Calibration and AFM Profilometry MRS-4SEM Magnification Standard and Stage Micrometer MRS 4 The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies and Profilometry STM, AFM, the pattern height is 70nm Optical Microscopy transmitted, reflected, bright dark field, differential contrast and confocal

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